ICTP - LB (Euler Lecture Hall)
Radiation damage during analysis
- Roger WEBB
Ion beam analysis is a characterisation technique that is not deliberately destructive. However, an energetic beam of particles is used to probe the sample, and energy is deposited in the sample with a possibility to cause radiation damage during analysis. The question is, does it change the sample for analytical purposes? What is the damage mechanism and how it can be minimized.