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Contribution

ICTP - LB (Euler Lecture Hall)

Radiation damage during analysis

Speakers

  • Roger WEBB

Description

Ion beam analysis is a characterisation technique that is not deliberately destructive. However, an energetic beam of particles is used to probe the sample, and energy is deposited in the sample with a possibility to cause radiation damage during analysis. The question is, does it change the sample for analytical purposes? What is the damage mechanism and how it can be minimized.

Organizers

Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)

Co-sponsors