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VERSION:2.0
PRODID:-//CERN//INDICO//EN
BEGIN:VEVENT
SUMMARY:High-resolution X-Ray Emission spectroscopy and XAFS: applications
  using calibrated instrumentation
DTSTART;VALUE=DATE-TIME:20160407T151500Z
DTEND;VALUE=DATE-TIME:20160407T161500Z
DTSTAMP;VALUE=DATE-TIME:20240319T030723Z
UID:indico-contribution-119@ictp.it
DESCRIPTION:Speakers: BURKHARD BECKHOFF (PTB-Berlin\, Germany)\n//indico.i
 ctp.it/event/7594/session/23/contribution/119
LOCATION:ICTP Leonardo Building - Euler Lecture Hall
URL://indico.ictp.it/event/7594/session/23/contribution/119
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