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SUMMARY:Secondary Ion Mass Spectroscopy - SIMS\, Cluster-SIMS and MeV-SIMS
DTSTART;VALUE=DATE-TIME:20160928T090000Z
DTEND;VALUE=DATE-TIME:20160928T100000Z
DTSTAMP;VALUE=DATE-TIME:20260416T073238Z
UID:indico-contribution-14@ictp.it
DESCRIPTION:Speakers: WEBB\, Roger (University of Surrey\, Guildford\, UK)
 \nThe basic concepts behind SIMS will be provided. The underlying models o
 f the molecular and ion ejection process will be given. The similarities a
 nd differences between MeV-SIMS and the more conventional cluster keV-SIMS
  will be given. Simulations of molecular ejection from molecular material 
 due to deposited energy spikes will be used to demonstrate the underlying 
 physical mechanisms behind the MeV and cluster keV-SIMS process. A descrip
 tion of what can be expected to be achieved from MeV-SIMS and cluster SIMS
  and their position in the great collection of materials analysis techniqu
 es in existence today. Comparison is made with other molecular concentrati
 on mapping techniques.\n\n//indico.ictp.it/event/7638/session/2/contributi
 on/14
LOCATION:ICTP LB (Euler Lecture Hall)
URL://indico.ictp.it/event/7638/session/2/contribution/14
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