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VERSION:2.0
PRODID:-//CERN//INDICO//EN
BEGIN:VEVENT
SUMMARY:Pitfalls in IBA data analysis (I)
DTSTART;VALUE=DATE-TIME:20160928T063000Z
DTEND;VALUE=DATE-TIME:20160928T073000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-0-12@ictp.it
DESCRIPTION:Speakers: BARRADAS\, Nuno P. (Instituto Superior Técnico\, Li
 sbon\, Portugal)\nIon beam analysis is a quantitative analytical group of 
 techniques\, and the purpose of this lecture is to show how to avoid many 
 pitfalls that often prevent IBA techniques from determining elemental dept
 h profiles accurately. In fact\, IBA is fraught with pitfalls. There are v
 ery many things that can be done wrong or simply go wrong unless great car
 e is taken. We will first address pitfalls coming from experimental issues
 \, namely: lost beam and events\, calibration of fixed parameters\, unwant
 ed target-beam interactions\, and other effects. These are not only releva
 nt\, but in fact essential to data analysis\, because problematic data tha
 t are not what the analyst thinks it is\, will lead to wrong conclusions\,
   and it is often possible to  identify issues in the data during data ana
 lysis. Then we will address pitfalls related to data analysis itself. With
  codes such as NDF (DataFurnace)\, that include a great deal of advanced p
 hysics and effects\, and allow the user to fit parameters such as beam ene
 rgy\, angles of scattering and of incidence\, or even the stopping powers 
 and cross sections\, the scope for error increased enormously. At the same
  time\, many new IBA users no longer have a heavy background in nuclear or
  ion beam physics\, and reliance on computer programs is a given. We will 
 use real life examples to illustrate some of the most common pitfalls in I
 BA data analysis\, along with steps that can be taken to prevent or remedy
  such problems.\n\n//indico.ictp.it/event/7638/session/2/contribution/12
LOCATION:ICTP LB (Euler Lecture Hall)
URL://indico.ictp.it/event/7638/session/2/contribution/12
END:VEVENT
BEGIN:VEVENT
SUMMARY:Pitfalls in IBA data analysis (II) - Calculation of uncertainty bu
 dget
DTSTART;VALUE=DATE-TIME:20160928T073000Z
DTEND;VALUE=DATE-TIME:20160928T083000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-0-13@ictp.it
DESCRIPTION:Speakers: BARRADAS\, Nuno P. (Instituto Superior Técnico\, Li
 sbon\, Portugal)\nOne of the advantages of IBA techniques over many other 
 competitive techniques is that quantification can often be made from first
  principles\, leading to claims of high traceable accuracy. However\, many
  published works do not quote uncertainties on the values reported\, and w
 hen they do\, it is very common that the uncertainties quoted reflect only
  the statistics of the experiment. In fact\, statistics is just one source
  of uncertainty in IBA experiments\, and almost always not the most import
 ant. The uncertainty budget is specified as a formal approach to the syste
 matic evaluation of the uncertainty of a measurement. It is the statement 
 of a measurement uncertainty\, of the components of that measurement uncer
 tainty and of their calculation and combination. The concepts involved wil
 l be described with special reference to IBA\, and practical examples will
  be developed\, explaining the practical steps of how to calculate realist
 ic uncertainties in IBA.\n\n//indico.ictp.it/event/7638/session/2/contribu
 tion/13
LOCATION:ICTP LB (Euler Lecture Hall)
URL://indico.ictp.it/event/7638/session/2/contribution/13
END:VEVENT
BEGIN:VEVENT
SUMMARY:Secondary Ion Mass Spectroscopy - SIMS\, Cluster-SIMS and MeV-SIMS
DTSTART;VALUE=DATE-TIME:20160928T090000Z
DTEND;VALUE=DATE-TIME:20160928T100000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-0-14@ictp.it
DESCRIPTION:Speakers: WEBB\, Roger (University of Surrey\, Guildford\, UK)
 \nThe basic concepts behind SIMS will be provided. The underlying models o
 f the molecular and ion ejection process will be given. The similarities a
 nd differences between MeV-SIMS and the more conventional cluster keV-SIMS
  will be given. Simulations of molecular ejection from molecular material 
 due to deposited energy spikes will be used to demonstrate the underlying 
 physical mechanisms behind the MeV and cluster keV-SIMS process. A descrip
 tion of what can be expected to be achieved from MeV-SIMS and cluster SIMS
  and their position in the great collection of materials analysis techniqu
 es in existence today. Comparison is made with other molecular concentrati
 on mapping techniques.\n\n//indico.ictp.it/event/7638/session/2/contributi
 on/14
LOCATION:ICTP LB (Euler Lecture Hall)
URL://indico.ictp.it/event/7638/session/2/contribution/14
END:VEVENT
BEGIN:VEVENT
SUMMARY:Bus transfer to Synchrotron Elettra
DTSTART;VALUE=DATE-TIME:20160928T110000Z
DTEND;VALUE=DATE-TIME:20160928T120000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-2-15@ictp.it
DESCRIPTION:Speakers: \nPick up from LB parking lot at 13:15\n\n//indico.i
 ctp.it/event/7638/session/2/contribution/15
LOCATION:Elettra Sincrotrone Trieste
URL://indico.ictp.it/event/7638/session/2/contribution/15
END:VEVENT
BEGIN:VEVENT
SUMMARY:Welcome and overview of Synchrotron-based analytical techniques an
 d Elettra
DTSTART;VALUE=DATE-TIME:20160928T120000Z
DTEND;VALUE=DATE-TIME:20160928T130000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-2-27@ictp.it
DESCRIPTION:Speakers: GREGORATTI\, Luca (Elettra Sincrotrone Trieste)\n//i
 ndico.ictp.it/event/7638/session/2/contribution/27
LOCATION:Elettra Sincrotrone Trieste
URL://indico.ictp.it/event/7638/session/2/contribution/27
END:VEVENT
BEGIN:VEVENT
SUMMARY:Laboratory visit
DTSTART;VALUE=DATE-TIME:20160928T130000Z
DTEND;VALUE=DATE-TIME:20160928T140000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-2-28@ictp.it
DESCRIPTION:Speakers: GREGORATTI\, Luca (Elettra Sincrotrone Trieste)\n//i
 ndico.ictp.it/event/7638/session/2/contribution/28
LOCATION:Elettra Sincrotrone Trieste
URL://indico.ictp.it/event/7638/session/2/contribution/28
END:VEVENT
BEGIN:VEVENT
SUMMARY:The SYRMEP X-ray imaging beamline at Elettra: recent achievements 
 and future perspectives
DTSTART;VALUE=DATE-TIME:20160928T140000Z
DTEND;VALUE=DATE-TIME:20160928T143000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-2-29@ictp.it
DESCRIPTION:Speakers: TROMBA\, Giuliana (Elettra Sincrotrone Trieste)\n//i
 ndico.ictp.it/event/7638/session/2/contribution/29
LOCATION:Elettra Sincrotrone Trieste
URL://indico.ictp.it/event/7638/session/2/contribution/29
END:VEVENT
BEGIN:VEVENT
SUMMARY:Presentation of the TwinMic beamline
DTSTART;VALUE=DATE-TIME:20160928T143000Z
DTEND;VALUE=DATE-TIME:20160928T153000Z
DTSTAMP;VALUE=DATE-TIME:20260419T043854Z
UID:indico-contribution-2-2-30@ictp.it
DESCRIPTION:Speakers: GIANONCELLI\, Alessandra (Elettra Sincrotrone Triest
 e)\n//indico.ictp.it/event/7638/session/2/contribution/30
LOCATION:Elettra Sincrotrone Trieste
URL://indico.ictp.it/event/7638/session/2/contribution/30
END:VEVENT
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