Fully atomistic approach for ion channeling analysis of defects in Si
Place
Location: Trieste - Italy
Date:
26 Jun 11:30 - 12:30
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Presented by G. LULLI (CNR, BOLOGNA)
on
26/6/2006
at
11:30
Organizers
Directors: A.P. Pathak, P. Mazzoldi, G. Lulli; C. Tuniz (
ICTP Local Organizer)
ICTP Local Organizer)