Fully atomistic approach for ion channeling analysis of defects in Si
Place
Location: Trieste - Italy
Date:
26 Jun 11:30 - 12:30
Timetable | Contribution List
Organizers
Directors: A.P. Pathak, P. Mazzoldi, G. Lulli; C. Tuniz (
ICTP Local Organizer)
ICTP Local Organizer)