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X-Ray Emission Techniques for Forensic Applications | (smr 1843)
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  • Monday, 28 May 2007
    • 09:00 - 09:30 REGISTRATION 
      Outside Kastler lecture hall.
      Location: Adriatico Guest House (Lower Level 1)
      • 09:00 REGISTRATION 30'
    • 09:30 - 10:30 Break for Administrative Purposes
      • 09:30 Break for Administrative Purposes 1h0'
    • 10:30 - 10:45 Opening Address
      • 10:30 Opening Address 15'
        Speaker: Workshop Directors
    • 10:45 - 11:45 Review of nuclear techniques for forensic applications
      • 10:45 Review of nuclear techniques for forensic applications 1h0'
        Speaker: C.Tuniz (Abdus Salam International Centre for Theoretical Physics)
    • 11:45 - 12:45 Possible applications of microimaging and microtomography in forensics
      • 11:45 Possible applications of microimaging and microtomography in forensics 1h0'
        Speaker: F. Zanini (Sincrotrone Trieste S.C.p.A.)
        Material: lecture notes
    • 12:45 - 14:00 LUNCH BREAK
      • 12:45 LUNCH BREAK 1h15'
    • 14:00 - 15:00 Portable XRF spectrometers for in-situ measurements - methodology and applications
      • 14:00 Portable XRF spectrometers for in-situ measurements - methodology and applications 1h0'
        Speaker: A.Markowicz (International Atomic Energy Agency (IAEA), Vienna)
        Material: lecture notes
    • 15:00 - 15:15 Coffee break
      • 15:00 Coffee break 15'
    • 15:15 - 16:15 X-ray tube-based microanalytical techniques at the IAEA Laboratories in Seibersdorf
      • 15:15 X-ray tube-based microanalytical techniques at the IAEA Laboratories in Seibersdorf 1h0'
        Speaker: D.Wegrzynek (International Atomic Energy Agency (IAEA), Vienna)
        Material: lecture notes
    • 17:00 - 18:00 SMALL RECEPTION
      • 17:00 SMALL RECEPTION 1h0'
  • Tuesday, 29 May 2007
    • 09:00 - 10:00 Gunshot Residue (GSD) analysis with SEM/RDX and applications of micro-XRF and XRD techniques for (automotive) paint analysis and future glass and document analysis
      • 09:00 Gunshot Residue (GSD) analysis with SEM/RDX and applications of micro-XRF and XRD techniques for (automotive) paint analysis and future glass and document analysis 1h0'
        Speaker: B. Nys (National Institute for Criminalistics and Criminology, Brussels)
        Material: lecture notes
    • 10:00 - 10:30 Coffee break
      • 10:00 Coffee break 30'
    • 10:30 - 11:30 Methodology and forensic applications of total reflection X-ray fluoresnce
      • 10:30 Methodology and forensic applications of total reflection X-ray fluoresnce 1h0'
        Speaker: H. Miesbauer (Environmental Laboratory, Upper Austrian Government, Linz)
    • 11:30 - 11:45 Break
      • 11:30 Break 15'
    • 11:45 - 12:45 Ion beam analysis - methodology and forensic applications
      • 11:45 Ion beam analysis - methodology and forensic applications 1h0'
        Speaker: I. Bogdanovic Radovic (Rudjer Boskovic Institute, Zagreb)
        Material: lecture notes
    • 12:45 - 14:15 LUNCH BREAK
      • 12:45 LUNCH BREAK 1h30'
    • 14:15 - 15:15 Demonstration of (trans)portable XRF spectrometer
      • 14:15 Demonstration of (trans)portable XRF spectrometer 1h0'
        Speaker: D. Wegrzynek
    • 15:15 - 15:30 Coffee break
      • 15:15 Coffee break 15'
    • 15:30 - 16:30 Demonstration of (trans)portable XRF spectrometer
      • 15:30 Demonstration of (trans)portable XRF spectrometer 1h0'
        Speaker: D. Wegrzynek
  • Wednesday, 30 May 2007
    • 09:00 - 10:00 Applications of SEM/EDX, XRF and combined microRaman-microXRF spectrometer in examination of criminalistic traces like fragments of paint, glass, plastics and inks
      • 09:00 Applications of SEM/EDX, XRF and combined microRaman-microXRF spectrometer in examination of criminalistic traces like fragments of paint, glass, plastics and inks 1h0'
        Speaker: J. Zieba-Palus (Institute of Forensic Research, Krakow, Poland)
        Material: lecture notes
    • 10:00 - 10:30 Coffee break
      • 10:00 Coffee break 30'
    • 10:30 - 11:30 ase studies on \"authentic fakes\" and illicit trade of antiquitie
      • 10:30 ase studies on \"authentic fakes\" and illicit trade of antiquitie 1h0'
        Speaker: E. Aloupi (Thetis Authentics Ltd., Athens)
        Material: lecture notes
    • 11:30 - 11:45 Break
      • 11:30 Break 15'
    • 11:45 - 12:45 Role of non-destructive analysis in better documentation of cultural heritage artefacts in support of combating illicit trafficking
      • 11:45 Role of non-destructive analysis in better documentation of cultural heritage artefacts in support of combating illicit trafficking 1h0'
        Speaker: N. Civici (Institute of Nuclear Physics, Tirana)
        Material: lecture notes
    • 12:45 - 14:15 LUNCH BREAK
      • 12:45 LUNCH BREAK 1h30'
    • 14:15 - 15:15 Practical experiments with (trans)portable XRF spectrometer
      • 14:15 Practical experiments with (trans)portable XRF spectrometer 1h0'
        Speaker: D. Wegrzynek
    • 15:15 - 15:30 Coffee break
      • 15:15 Coffee break 15'
    • 15:30 - 16:30 Practical experiments with (trans)portable XRF spectrometer
      • 15:30 Practical experiments with (trans)portable XRF spectrometer 1h0'
        Speaker: D. Wegrzynek
  • Thursday, 31 May 2007
    • 09:00 - 10:00 Introduction to Synchrotron Radiation 1
      • 09:00 Introduction to Synchrotron Radiation 1 1h0'
        Speaker: Andrea Lausi (Sincrotrone Trieste S.C.p.A.)
        Material: lecture notes
    • 10:00 - 10:30 Coffee break
      • 10:00 Coffee break 30'
    • 10:30 - 11:30 X-ray diffraction for forensic Sciences
      • 10:30 X-ray diffraction for forensic Sciences 1h0'
        Speaker: Andrea Lausi
        Material: lecture notes
    • 11:30 - 11:45 Break
      • 11:30 Break 15'
    • 11:45 - 12:45 X-ray detectors
      • 11:45 X-ray detectors 1h0'
        Speaker: Ralf Menk (Sincrotrone Trieste S.C.p.A.)
    • 12:45 - 14:00 LUNCH BREAK
      • 12:45 LUNCH BREAK 1h15'
    • 14:00 - 15:00 Infrared spectromicroscopy: a tool for forensic science
      • 14:00 Infrared spectromicroscopy: a tool for forensic science 1h0'
        Speaker: Diane Eichert (Sincrotrone Trieste S.C.p.A.)
    • 15:00 - 15:15 Coffee break
      • 15:00 Coffee break 15'
    • 15:15 - 16:15 Feasibility of X-ray microscopy for forensic studies
      • 15:15 Feasibility of X-ray microscopy for forensic studies 1h0'
        Speaker: Burchard Kaulich (Sincrotrone Trieste S.C.p.A.)
  • Friday, 1 June 2007
    • 08:30 - 09:00 Transfer to Elettra 
      All participants are kindly asked to be punctual at 8:30 for departure to Elettra.
Pick-up by the waterfront Adriatico, near bus stand no. 36.
      • 08:30 Transfer to Elettra 30'
    • 09:30 - 10:30 Demonstration of XRF in Forensic Science 
      Demonstration to be held at Elettra
      • 09:30 Demonstration of XRF in Forensic Science 1h0'
    • 10:30 - 12:30 Tour of Elettra
      • 10:30 Tour of Elettra 2h0'
    • 12:30 - 13:00 Transfer to ICTP
      • 12:30 Transfer to ICTP 30'
    • 13:00 - 14:00 LUNCH BREAK
      • 13:00 LUNCH BREAK 1h0'
    • 14:30 - 16:00 Participants' Presentations
      • 14:30 Participants' Presentations 1h30'
    • 16:00 - 16:15 Coffee Break
      • 16:00 Coffee Break 15'
    • 16:15 - 17:15 ROUND TABLE DISCUSSION
      • 16:15 ROUND TABLE DISCUSSION 1h0'
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