Radiation effects in microelectronic devices
Place
Location: Trieste - Italy
Date:
16 Aug 09:00 - 10:30
Description
Microelectronic devices and detectors are exposed to harsh radiation environments in space and in large accelerators. Radiation can cause several effects that will lead to the degradation and malfunction of these devices. This lecture will give an introduction to the effect of radiation on microelectronic devices including single event effects. The use of ion beams in the study of these radiation effects will be presented with examples.
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Presented by GYORGY VIZKELETHY
on
16/8/2012
at
9:00
Organizers
IAEA: Aliz Simon and Andrej Zeman; Local Organiser: Sandro Scandolo