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DAY 1

Place

Location: ICTP
Address: Strada Costiera, 11 I - 34151 Trieste (Italy)
Room: LB (Euler Lecture Hall)
Date: 26 Sep 08:00 - 20:30

Timetable | Contribution List

Displaying 6 contributions out of 6
Session: DAY 1
Ion Beam Analysis techniques have traditionally been largely focussed at obtaining detailed information on the elemental constituents of a sample. For this they have a proven and highly successful track record. Many new materials problems are associated with molecular materials and elemental information alone often can not provide such useful information in these situations. The case for looking b ... More
Presented by Roger WEBB on 26/9/2016 at 13:00
Session: DAY 1
Heritage samples specificities (e.g. uniqueness, fragility, complexity, sensitivity to beam-induced modification) Large artefacts, complex shape (positioning) Often cannot stand vacuum Artefact safety (handling and damage risk reduction, AIEA TM) Main addressed questions (e.g. provenancing, manufacture, preservation) Which IBA techniques is suitable for each question Photon-based: PIXE/PIGE/IBIL P ... More
Presented by Thomas CALLIGARO on 26/9/2016 at 8:00
Session: DAY 1
Beam scanning implementation (magnetic deflection + mechanical displacement) Optimization of counting statistics and dwell time/pixel Motorized X/Y/Z sample holder Safety: large view/ microscope camera with recording He gas flow Magnetic deflector (PIXE for light elements) Optimal Filters Simultaneous techniques Beam charge monitoring techniques Radiation safety with external beams: rules and proc ... More
Presented by Thomas CALLIGARO on 26/9/2016 at 12:00
Session: DAY 1
Presented by Sandro SCANDOLO, Aliz SIMON on 26/9/2016 at 7:30
Session: DAY 1
The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. However, these techniques separately give only pa ... More
Presented by Nuno P. BARRADAS on 26/9/2016 at 14:30
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Organizers

Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)

Co-sponsors