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REGISTRATION OF VISITS:
- Participants NOT staying in the ICTP Guest Houses are kindly requested to complete registration formalities c/o the Secretariat (office no. 1, lower level 1, AGH).
- Visits of participants accommodated at the ICTP Guest Houses are registered upon arrival at the reception desks, directly (i.e. no need to register again with the secretariat).
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This conference will address recent theoretical and experimental developments in quantum measurement, underscoring common themes from the perspectives of foundations of quantum mechanics, quantum information processing, quantum optics, condensed matter physics and metrology.
Rooted in the early history of quantum mechanics, the field of Quantum Measurement has evolved from a purely mathematical formulation to an active research topic, embedded in a broad spectrum of subfields, ranging from quantum optics to condensed matter physics. It involves a variety of techniques, including quantum limited, fast, non-invasive measurements. As a versatile tool in an advanced quantum toolbox, quantum measurements could be empowered for the design of novel protocols, including active and passive error correction codes, quantum feedback control, precision measurements, quantum state discrimination, quantum metrology, quantum simulations and more.
In this context of diversified research, this meeting will bring together expert theorists and experimentalists, employing different facets of quantum measurement, with the goal of identifying common themes, and cross-fertilizing with new ideas.
A Poster Session will also be organized, and interested candidates are invited to upload a short abstract of their proposed posters during the online application process (max. half page, in pdf format).
Poster presentation is not mandatory, however participants are encouraged to present their results.
Foundations of quantum mechanics
Quantum measurement in information processing
Quantum measurements in nanodevices
Quantum measurement and thermodynamics
Quantum metrology and precision measurements
A. ACIN, ICFO, Spain
Y. AHARONOV, Tel Aviv University, Israel
A. AUFFEVES, Institute Neel, France
M. BARBIERI, Università Roma Tre, Italy
W. BELZIG, Konstanz University, Germany
P. BERTET, SPEC / CEA Saclay, France
Y. BLANTER, Delft University, the Netherlands
R. CHAVES, Institute of Physics Natal, Brasil
M. DEVORET, Yale University, USA
R. EGGER, University of Dusseldorf, Germany
J. EISERT, Freie Universitaet Berlin, Germany
K. ENSSLIN, ETH, Switzerland
A. FEDRIZZI, Heriot-Watt University, Edinburgh, UK
M. GENOVESE, INRIM, Italy
I. GORNI, KIT, Germany
B. HUARD, Ecole Normale Superieure de Lyon, France
A. JORDAN, University of Rochester, USA
E. KARIMI, Ottawa University, Canada
A. KOROTKOV, University of California, Riverside, USA
E. LAIRD, Lancaster University, UK
I. LERNER, University of Birmingham, UK
E. LUTZ, Stuttgart University, Germany
F. MARQUARDT, MPI Erlangen, Germany
M. MITCHELL, ICFO, Spain
K. MURCH, Washington University in St. Louis, USA
A. NITZAN, University of Pennsylvania, USA
I. SIDDIQI, UC Berkley, USA
K. SNIZHKO, Weizmann Institute of Science, Israel
A. STEINBERG, University of Toronto, Canada
M. UEDA, University of Tokyo, Japan
L. VAIDMAN, Tel Aviv University, Israel
V. VEDRAL, University of Oxford, UK
R. VIJAY, Tata Institute of Fundamental Research, India
H. WISEMAN, Griffith University, Australia
O. ZILBERBERG, ETH, Switzerland
There is no registration fee.
Online application is no longer possible (deadline expired 10 February 2019).