Gunshot Residue (GSD) analysis with SEM/RDX and applications of micro-XRF and XRD techniques for (automotive) paint analysis and future glass and document analysis
Place
Location: Trieste - Italy
Room: Adriatico Guest House Lecture Room A
Date:
29 May 09:00 - 10:00
Timetable | Contribution List
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Presented by B. NYS
on
29/5/2007
at
9:00
Organizers
Directors: A. Markowicz (IAEA, Vienna); G. Paolucci (Sincrotrone SCpA, Trieste); G. Mank (IAEA, Vienna);
ICTP Local Organizer: C. Tuniz
ICTP Local Organizer: C. Tuniz