Applications of SEM/EDX, XRF and combined microRaman-microXRF spectrometer in examination of criminalistic traces like fragments of paint, glass, plastics and inks
Place
Location: Trieste - Italy
Room: Adriatico Guest House Lecture Room A
Date:
30 May 09:00 - 10:00
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Presented by J. ZIEBA-PALUS
on
30/5/2007
at
9:00
Organizers
Directors: A. Markowicz (IAEA, Vienna); G. Paolucci (Sincrotrone SCpA, Trieste); G. Mank (IAEA, Vienna);
ICTP Local Organizer: C. Tuniz
ICTP Local Organizer: C. Tuniz