Heritage samples specificities (e.g. uniqueness, fragility, complexity, sensitivity to beam-induced modification)
Large artefacts, complex shape (positioning)
Often cannot stand vacuum
Artefact safety (handling and damage risk reduction, AIEA TM)
Main addressed questions (e.g. provenancing, manufacture, preservation)
Which IBA techniques is suitable for each question
Photon-based: PIXE/PIGE/IBIL
Particle-based: RBS/NRA/ERDA/SIMS
Ion imaging added value compared to classical imaging techniques 
Limiting factors in external IBA imaging (SRIM simulations)
Protons and helium ions: probe size
Energy straggling
Review of exit window material and size, and practically achieved resolution
Gas atmosphere (impact zone cooling)
Charge monitoring
Mechanical scan
Lowering beam intensity
Current challenges
IBA imaging of non-flat (3D) surfaces
Stereoscopic view using multiple detectors
Gamma-ray and particle detectors acceptance improvement
Use of heavy ion beams (e.g. 19F and 15N beams for NRA)

Beam scanning implementation (magnetic deflection + mechanical displacement)
Optimization of counting statistics and dwell time/pixel
Motorized X/Y/Z sample holder
Safety: large view/ microscope camera with recording
He gas flow
Magnetic deflector (PIXE for light elements)
Optimal Filters
Simultaneous techniques
Beam charge monitoring techniques
Radiation safety with external beams: rules and procedures

Ion Beam Analysis techniques have traditionally been largely focussed at obtaining detailed information on the elemental constituents of a sample. For this they have a proven and highly successful track record. Many new materials problems are associated with molecular materials and elemental information alone often can not provide such useful information in these situations. The case for looking beyond just elemental analysis is given. A technique first noticed utilized in the 1970s called Plasma Desorption Mass Spectrometry (PDMS) is described. Both the successes of this technique and what it accomplished, and also how it failed to take-off commercially will be detailed. How it led to a new set of ambient pressure techniques such as Matrix Assisted Laser Desorption Ionisation (MALDI) and then very recently to a new molecular concentration imaging technique MeV-SIMS will be described.

The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. However, these techniques separately give only partial information – the secret of “Total IBA” is to find synergies between techniques used simultaneously which efficiently give extra information. The essential point is to be able to analyse all data self-consistently and automatically, including any number of spectra from any combination of the techniques supported, taken from the same sample, with the same depth profile. The main concepts will be expanded with practical examples. 

Pedro L. Grande
In this talk, a review of of the energy-loss physics of ions interacting with matter will be presented. Special attention will be given to the electronic stopping power and energy loss straggling processes, which are of fundamental importance for depth profilling and for 3D characterization of nano-structures using the energy loss spectrum taken with high energy resolution. 

This lecture will provide  additional practical examples on total IBA.

MEIS is an ion beam characterization technique capable to determine with subnanometric depth resolution elemental composition and concentration-depth profiles in thin films. This technique is widely used for analysis of microelectronic materials as well as for the determination of structural and vibrational parameters of crystalline surfaces. In this talk the principles of MEIS will be given and a comparison with other high resolution techniques will be shown. Applications for depth profilling of  thin and ultra thin films using ions and cluster ions will be provided and typical pitfalls will be discussed.

Examples of the use of MEIS for the characterization of nanostructured materials through the software PowerMeis wil be given.  Some illustrative examples will be shown in this talk namely, characterization of Au and core-shell NPs exposed on the surface, system of buried NPs synthesized by ion implantation, swift-heavy ion-sputtered CaF2 nanoparticles, and finally trench arrays used to build 3D transistors. 

Ion beam analysis is a quantitative analytical group of techniques, and the purpose of this lecture is to show how to avoid many pitfalls that often prevent IBA techniques from determining elemental depth profiles accurately. In fact, IBA is fraught with pitfalls. There are very many things that can be done wrong or simply go wrong unless great care is taken. We will first address pitfalls coming from experimental issues, namely: lost beam and events, calibration of fixed parameters, unwanted target-beam interactions, and other effects. These are not only relevant, but in fact essential to data analysis, because problematic data that are not what the analyst thinks it is, will lead to wrong conclusions,  and it is often possible to  identify issues in the data during data analysis. Then we will address pitfalls related to data analysis itself. With codes such as NDF (DataFurnace), that include a great deal of advanced physics and effects, and allow the user to fit parameters such as beam energy, angles of scattering and of incidence, or even the stopping powers and cross sections, the scope for error increased enormously. At the same time, many new IBA users no longer have a heavy background in nuclear or ion beam physics, and reliance on computer programs is a given. We will use real life examples to illustrate some of the most common pitfalls in IBA data analysis, along with steps that can be taken to prevent or remedy such problems.

One of the advantages of IBA techniques over many other competitive techniques is that quantification can often be made from first principles, leading to claims of high traceable accuracy. However, many published works do not quote uncertainties on the values reported, and when they do, it is very common that the uncertainties quoted reflect only the statistics of the experiment. In fact, statistics is just one source of uncertainty in IBA experiments, and almost always not the most important. The uncertainty budget is specified as a formal approach to the systematic evaluation of the uncertainty of a measurement. It is the statement of a measurement uncertainty, of the components of that measurement uncertainty and of their calculation and combination. The concepts involved will be described with special reference to IBA, and practical examples will be developed, explaining the practical steps of how to calculate realistic uncertainties in IBA.

The basic concepts behind SIMS will be provided. The underlying models of the molecular and ion ejection process will be given. The similarities and differences between MeV-SIMS and the more conventional cluster keV-SIMS will be given. Simulations of molecular ejection from molecular material due to deposited energy spikes will be used to demonstrate the underlying physical mechanisms behind the MeV and cluster keV-SIMS process. A description of what can be expected to be achieved from MeV-SIMS and cluster SIMS and their position in the great collection of materials analysis techniques in existence today. Comparison is made with other molecular concentration mapping techniques.

Pick up from LB parking lot at 13:15

The main concepts in RBS are the kinematic factor, the scattering cross sections, and the energy loss, which allow us to answer three fundamental questions about a sample: what elements are present in the sample?; how much of each element is present?; and where are the elements located? When combined with spatially resolved measurements (e.g. using a microbeam), in  principle it should be possible to derive 3D information about inhomogeneous samples  - this is RBS tomography, a concept proposed many years ago, but not fully realized. However, new methods of data evaluation now exist, that are opening up possibilities to the analyst. This lecture will first focus on the possibilities and methods behind RBS tomography, and then will go on to show how to calculate depth resolution as function  of depth, which is one of the essential limitations and factors to be considered in analysis.

Data acquisition and software processing tools
GeoPIXE
DAN32
PYMCA fast fitting, PCA, NNMA
AGLAEMaps (automated processing of datacube series)
Future: RBS and NRA image processing

Ion beam analysis is a characterisation technique that is not deliberately destructive.  However, an energetic beam of particles is used to probe the sample, and  energy is deposited in the sample with a possibility to cause radiation damage during analysis.   The question is, does it change the sample for analytical purposes? What is the damage mechanism and how it can be minimized.

This lecture will show case examples of IBA applied to materials science, demonstrating the capabilities of the techniques in demanding situations.

The use of cloud computing for the simulation of MEIS/RBS
spectra is showed. The integration of PowerMEIS with a
web server provides to users worldwide a platform to make and
analyze simulations through any modern web browser. An
asynchronos server algorithm handles simultaneous simulations,
allowing for multiple users at the same time. This platform was
extensively used for all MEIS spectra fittings during a recent
MEIS Round Robin Table.

With laboratory-based chemical imaging techniques (e.g. X-ray radiography, SEM-EDX, Raman, MA-XRF)
With large scale facility (e.g. Synchrotron, Neutron sources)
 Synchrotron Neutron source external IBA
XRF  NAA  PIXE, PIGE
XAS  n-Radiography RBS, NRA
XRD  n-Diffraction IBIL
Emerging techniques 
Full field XRF MeV-TOF SIMS

In this session the participants can freely ask for advice about technical problems,  how to chose the best technique(s) for analysis, data evaluation etc. 

Please bring your problematic spectra and feel free to ask! 

This lecture will show case examples of MEIS and IBA applied to materials science, demonstrating the capabilities of the techniques in demanding situations.

Inventory of Lapis lazuli mineral phases and associated trace elements: determination of Lapis provenance and authentication of artefacts of unknown provenance
Coupled IBIL/PIXE study of pre-Columbian jadeite

Comparison of PIXE and XRF imaging of paintings: analysis of a 19th copy of ‘La Bohémienne’ by Frans Hals.
Insights on damage induced in the most sensitive constituents.
Exploring safe limits for IBA imaging of paintworks.
Processing state-of-the-art MA-XRF datacubes recorded on da Vinci masterpieces.