Joint ICTP-IAEA Advanced Workshop on High Sensitivity 2D & 3D Characterisation and Imaging with Ion Beams | (smr 2856)
Starts 26 Sep 2016
Ends 30 Sep 2016
Central European Time
LB (Euler Lecture Hall)
Strada Costiera, 11
I - 34151 Trieste (Italy)
The Abdus Salam International Centre for Theoretical Physics (ICTP), Trieste, Italy, in cooperation with the International Atomic Energy Agency (IAEA), Vienna, Austria, has organized an Advanced Worskhop on High Sensitivity 2D & 3D Characterisation and Imaging with Ion Beams, held in Trieste from 26 to 30 September 2016.
Accelerator-based analytical techniques using focussed ion beams are very powerful and versatile tools for elemental characterisation and mapping of broad range of materials. Beside their multi-elemental and fairly non-destructive feature, recent developments with regard of the imaging and detection systems make their performance exclusive both from the respect of sensitivity, accuracy, high lateral and depth resolution as well as 2D and 3D mapping. New applications have recently opened up by using swift heavy ions to create secondary ions and perform mass spectrometry on these, and to provide molecular information beyond the elemental analysis. These developments are extremely powerful spectroscopic tools, often providing complementary information on the structure and composition of materials, being applied to a wide range of scientific problems in material science, microelectronics, biology, biomedicine, geology, environmental science and archaeometry.
In the past few years, the advances in ion optics have allowed the use focused ion beams down to spot sizes in the micro- and nanometer range. This technical advancement has remarkably increased the analytical capability of conventional spectroscopic techniques for materials analysis, both in terms of spatial resolution and sensitivity to composition and physical-chemical properties. However, it is important to note that it also enhances effects which are more or less negligible with standard ion beam analysis (millimeter beamsize). Other challenges are the analysis of nanostructures with standard Ion Beam Analysis (IBA) or multiple measurements using multiple detectors which become more and more widespread. Recent data evaluation code developments make it possible to improve the analytical results also at the sub-micrometer level, but it requires a coordinated effort to transfer the new knowledge into good practice in the laboratories.
IBA is considered to be a non-destructive technique. With increased beam brightness at small spot sizes however, radiation damage can take place. This Workshop aimed to increase the awareness of the analysts and provide guidelines on how to minimize the effect of radiation damage during the analysis.
The Workshop seeked to review the state-of-the-art in the area of analysis. Theoretical basic principles, recent developments and applications and software developments have been covered. Beside lectures, practical sessions on data evaluation are planned. The Workshop has provided an advanced training and information exchange platform for early stage researchers interested in this important subject.
As a complementary technique, visit of the beamline Elettra-Sincrotrone Trieste has been part of the programme.
Participants had an opportunity to present and discuss their results in a poster session. Scientific discussions have stimulated further development and co-operation among the participants.
Nuno P. BARRADAS
Instituto Superior Técnico,
C2RMF-AGLAE Laboratory, Paris, France
Pedro Luis GRANDE
Federal University of Rio Grande do Sul, Porto Alegre, Brazil
ELETTRA, Trieste, Italy
• Total IBA: synergistic treatment of data from multiple IBA techniques
• Learning and using state of the art codes to affect the IBA analyses
• Pitfalls in IBA data analysis
• Beyond elemental analysis; MeV-SIMS High resolution PIXE
• Multi-elemental characterisation and 2D mapping
• Depth profiling and 3D tomography
• Radiation effects/Radiation damage
• Applications and case studies to material science, biology-biomedicine, geology, environmental science, art and archaeometry
• How to choose the best tools for analysis
Participants have presented the results of their research in the form of a poster.
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Participation upon selection/invitation only.
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Contact for any queries: ICTP secretariat, Nicoletta Ivanissevich