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Contribution

ICTP - LB (Euler Lecture Hall)

X-ray Reflectometry: Principles and Analytical applications

Speakers

  • M. TIWARI

Primary authors

  • M. TIWARI (Raja Ramana Centre For Advanced Technology, Indore - India)

Organizers

B. Beckhoff (PTB, Berlin), A. Karydas (IAEA, Vienna), L. Gregoratti (ELETTRA, Trieste),
ICTP Local Organizer: N. Binggeli

Co-sponsors