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Location: ICTP
Address: Strada Costiera, 11 I - 34151 Trieste (Italy)
Room: LB (Euler Lecture Hall)
Date: 29 Sep 08:30 - 17:30

Timetable | Contribution List

Displaying 7 contributions out of 7
Session: DAY 4
This lecture will show case examples of IBA applied to materials science, demonstrating the capabilities of the techniques in demanding situations.
Presented by Nuno P. BARRADAS on 29/9/2016 at 10:00
Session: DAY 4
With laboratory-based chemical imaging techniques (e.g. X-ray radiography, SEM-EDX, Raman, MA-XRF) With large scale facility (e.g. Synchrotron, Neutron sources) Synchrotron Neutron source external IBA XRF NAA PIXE, PIGE XAS n-Radiography RBS, NRA XRD n-Diffraction IBIL Emerging techniques Full field XRF MeV-TOF SIMS
Presented by Thomas CALLIGARO on 29/9/2016 at 13:30
Session: DAY 4
The main concepts in RBS are the kinematic factor, the scattering cross sections, and the energy loss, which allow us to answer three fundamental questions about a sample: what elements are present in the sample?; how much of each element is present?; and where are the elements located? When combined with spatially resolved measurements (e.g. using a microbeam), in principle it should be possible ... More
Presented by Nuno P. BARRADAS on 29/9/2016 at 6:30
Session: DAY 4
In this session the participants can freely ask for advice about technical problems, how to chose the best technique(s) for analysis, data evaluation etc. Please bring your problematic spectra and feel free to ask!
Presented by Roger WEBB, AND ALL LECTURERS on 29/9/2016 at 14:30
Session: DAY 4
The use of cloud computing for the simulation of MEIS/RBS spectra is showed. The integration of PowerMEIS with a web server provides to users worldwide a platform to make and analyze simulations through any modern web browser. An asynchronos server algorithm handles simultaneous simulations, allowing for multiple users at the same time. This platform was extensively used for all MEIS spectra fitti ... More
Presented by Pedro L. GRANDE on 29/9/2016 at 12:30
Session: DAY 4
Ion beam analysis is a characterisation technique that is not deliberately destructive. However, an energetic beam of particles is used to probe the sample, and energy is deposited in the sample with a possibility to cause radiation damage during analysis. The question is, does it change the sample for analytical purposes? What is the damage mechanism and how it can be minimized.
Presented by Roger WEBB on 29/9/2016 at 9:00
Session: DAY 4
Data acquisition and software processing tools GeoPIXE DAN32 PYMCA fast fitting, PCA, NNMA AGLAEMaps (automated processing of datacube series) Future: RBS and NRA image processing
Presented by Thomas CALLIGARO on 29/9/2016 at 7:30
Building timetable...


Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)