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DAY 1
DAY 2
DAY 3
DAY 4
DAY 5
Displaying
31
contributions
out of
31
3D Characterization with MEIS
Session:
DAY 2
Beyong Elemental Analysis: Elemental, Chemical and Molecular Imaging
Session:
DAY 1
Bus transfer to Synchrotron Elettra
Session:
DAY 3
Case study (I) - Materials science
Session:
DAY 4
Case study (II) - Nanomaterials
Session:
DAY 5
Case study (III) - Cultural Heritage materials and objects
Session:
DAY 5
Comparison of External Ion Imaging Techniques with Alternative Techniques
Session:
DAY 4
Depth profiling and 3D tomography for 3D RBS such as Corteo, Maria, and for calculation of depth resolution
Session:
DAY 4
Evaluation of the Workshop: Best poster award, and Closing of the Workshop
Session:
DAY 5
External nuclear microprobe specificities and challenges
Session:
DAY 1
Fundamentals of Energy Loss
Session:
DAY 2
Hands-on processing of data recorded on real samples using PYMCA
Session:
DAY 5
IBA-clinic
Session:
DAY 4
Implementation of External Ion Beam Imaging
Session:
DAY 1
Laboratory visit
Session:
DAY 3
Opening of the Workshop and Introduction of the participants
Session:
DAY 1
Overview of the ICTP and IAEA relevant activities
Session:
DAY 1
POSTER SESSION
Session:
DAY 2
Pitfalls in IBA data analysis (I)
Session:
DAY 3
Pitfalls in IBA data analysis (II) - Calculation of uncertainty budget
Session:
DAY 3
Poster presentations: short oral presentation by each participant
Session:
DAY 2
PowerMeis software
Session:
DAY 4
Presentation of the TwinMic beamline
Session:
DAY 3
Principles and application of MEIS
Session:
DAY 2
Radiation damage during analysis
Session:
DAY 4
Secondary Ion Mass Spectroscopy - SIMS, Cluster-SIMS and MeV-SIMS
Session:
DAY 3
State of the art codes to affect the IBA analysis
Session:
DAY 4
The SYRMEP X-ray imaging beamline at Elettra: recent achievements and future perspectives
Session:
DAY 3
Total IBA: Synergistic treatment of data from multiple IBA techniques (I)
Session:
DAY 1
Total IBA: Synergistic treatment of data from multiple IBA techniques (II)
Session:
DAY 2
Welcome and overview of Synchrotron-based analytical techniques and Elettra
Session:
DAY 3
Organizers
Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)
Co-sponsors