Ion Beam Analysis techniques have traditionally been largely focussed at obtaining detailed information on the elemental constituents of a sample. For this they have a proven and highly successful track record. Many new materials problems are associated with molecular materials and elemental information alone often can not provide such useful information in these situations. The case for looking beyond just elemental analysis is given. A technique first noticed utilized in the 1970s called Plasma Desorption Mass Spectrometry (PDMS) is described. Both the successes of this technique and what it accomplished, and also how it failed to take-off commercially will be detailed. How it led to a new set of ambient pressure techniques such as Matrix Assisted Laser Desorption Ionisation (MALDI) and then very recently to a new molecular concentration imaging technique MeV-SIMS will be described.