The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. However, these techniques separately give only partial information – the secret of “Total IBA” is to find synergies between techniques used simultaneously which efficiently give extra information. The essential point is to be able to analyse all data self-consistently and automatically, including any number of spectra from any combination of the techniques supported, taken from the same sample, with the same depth profile. The main concepts will be expanded with practical examples.