Joint ICTP-IAEA Workshop on "Advanced Ion Beam Techniques: Imaging and Characterisation with MeV ions" | (smr 2488) (30 September 2013

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Displaying 6 authors out of 6

Opening of the Workshop and Introduction of the Participants

2 min. poster presentations by each participants

CHRIS JEYNES (University of Surrey, Guildford, UK)

Fundamentals of the IBA techniques: Experimental

Uncertainty budget

Interpretation of IBA data: depth profiling and channeling, isotops (heavy ion ERDA and NRA)

Total IBA case studies

Computer exercise PIXE data analysis (GUPIX)

Computer exercise Total IBA

Advanced components, SRIM and IBANDL

Radiation damage and minimizing its effect in IBA

MOHAMAD ROUMIE (National Council for Scientific Research, Beirut, Lebanon)

Case studies of IBA and ToF-SIMS applications at LAEC

NUNO BARRADAS (Instituto Tecnologico e Nuclear, Sacavem, Portugal)

Fundamentals of the IBA techniques: Theory (including depth profiling)

Computer exercise Introduction to RBS simulation

Computer exercise Combined particle techniques: RBS, EBS and ERDA

Overview of PIXE, standard; high-resolution and heavy ion-PIXE

Beyond single particle scattering off flat surfaces

Pitfalls of IBA

NDF advanced capabilities

Real time IBA and neural networks

Computer exercise IBA: Selected practical problems

ROGER WEBB (University of Surrey, UK)

Ion Beam Analysis techniques (general overview of the techniques)

Beyond elemental analysis: MeV-SIMS

Fundamentals of MeV-SIMS: concepts

Fundamentals of MeV-SIMS: experimental setup

Multivariate analysis

Computer exercise Multivariate analysis

MeV-SIMS case studies

Aliz Simon (NAPC/Physics Section) and C. Tuniz (ICTP)