Contribution
Speakers
- Thomas CALLIGARO
Description
Beam scanning implementation (magnetic deflection + mechanical displacement)
Optimization of counting statistics and dwell time/pixel
Motorized X/Y/Z sample holder
Safety: large view/ microscope camera with recording
He gas flow
Magnetic deflector (PIXE for light elements)
Optimal Filters
Simultaneous techniques
Beam charge monitoring techniques
Radiation safety with external beams: rules and procedures