DAY 1
Place
Location: ICTP
Address: Strada Costiera, 11
I - 34151 Trieste (Italy)
Room: LB (Euler Lecture Hall)
Date:
26 Sep 08:00 - 20:30
Timetable | Contribution List
Displaying 6
contributions
out of
6
Session:
DAY 1
Ion Beam Analysis techniques have traditionally been largely focussed at obtaining detailed information on the elemental constituents of a sample. For this they have a proven and highly successful track record. Many new materials problems are associated with molecular materials and elemental information alone often can not provide such useful information in these situations. The case for looking b
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Presented by Roger WEBB
on
26/9/2016
at
13:00
Session:
DAY 1
Heritage samples specificities (e.g. uniqueness, fragility, complexity, sensitivity to beam-induced modification)
Large artefacts, complex shape (positioning)
Often cannot stand vacuum
Artefact safety (handling and damage risk reduction, AIEA TM)
Main addressed questions (e.g. provenancing, manufacture, preservation)
Which IBA techniques is suitable for each question
Photon-based: PIXE/PIGE/IBIL
P
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Presented by Thomas CALLIGARO
on
26/9/2016
at
8:00
Session:
DAY 1
Beam scanning implementation (magnetic deflection + mechanical displacement)
Optimization of counting statistics and dwell time/pixel
Motorized X/Y/Z sample holder
Safety: large view/ microscope camera with recording
He gas flow
Magnetic deflector (PIXE for light elements)
Optimal Filters
Simultaneous techniques
Beam charge monitoring techniques
Radiation safety with external beams: rules and proc
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Presented by Thomas CALLIGARO
on
26/9/2016
at
12:00
Session:
DAY 1
The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. However, these techniques separately give only pa
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Presented by Nuno P. BARRADAS
on
26/9/2016
at
14:30