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DAY 2
Place
Location: ICTP
Address: Strada Costiera, 11
I - 34151 Trieste (Italy)
Examples of the use of MEIS for the characterization of nanostructured materials through the software PowerMeis wil be given. Some illustrative examples will be shown in this talk namely, characterization of Au and core-shell NPs exposed on the surface, system of buried NPs synthesized by ion implantation, swift-heavy ion-sputtered CaF2 nanoparticles, and finally trench arrays used to build 3D tr
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Presented by Pedro L. GRANDE
on
27/9/2016
at
10:00
Pedro L. Grande
In this talk, a review of of the energy-loss physics of ions interacting with matter will be presented. Special attention will be given to the electronic stopping power and energy loss straggling processes, which are of fundamental importance for depth profilling and for 3D characterization of nano-structures using the energy loss spectrum taken with high energy resolution.
MEIS is an ion beam characterization technique capable to determine with subnanometric depth resolution elemental composition and concentration-depth profiles in thin films. This technique is widely used for analysis of microelectronic materials as well as for the determination of structural and vibrational parameters of crystalline surfaces. In this talk the principles of MEIS will be given and
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