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DAY 3
Place
Location: ICTP
Address: Strada Costiera, 11
I - 34151 Trieste (Italy)
Room: LB (Euler Lecture Hall)
Date:
28 Sep 08:30 - 18:00
Timetable | Contribution List
Displaying 8
contributions
out of
8
Session:
DAY 3
Ion beam analysis is a quantitative analytical group of techniques, and the purpose of this lecture is to show how to avoid many pitfalls that often prevent IBA techniques from determining elemental depth profiles accurately. In fact, IBA is fraught with pitfalls. There are very many things that can be done wrong or simply go wrong unless great care is taken. We will first address pitfalls coming
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Presented by Nuno P. BARRADAS
on
28/9/2016
at
6:30
Session:
DAY 3
One of the advantages of IBA techniques over many other competitive techniques is that quantification can often be made from first principles, leading to claims of high traceable accuracy. However, many published works do not quote uncertainties on the values reported, and when they do, it is very common that the uncertainties quoted reflect only the statistics of the experiment. In fact, statisti
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Presented by Nuno P. BARRADAS
on
28/9/2016
at
7:30
Session:
DAY 3
The basic concepts behind SIMS will be provided. The underlying models of the molecular and ion ejection process will be given. The similarities and differences between MeV-SIMS and the more conventional cluster keV-SIMS will be given. Simulations of molecular ejection from molecular material due to deposited energy spikes will be used to demonstrate the underlying physical mechanisms behind the M
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Presented by Roger WEBB
on
28/9/2016
at
9:00
Organizers
Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)
