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Displaying 11 speakers out of 11
ALL PARTICIPANTS AND FACULTY
Poster presentations: short oral presentation by each participant
AND ALL LECTURERS
IBA-clinic
BARRADAS, Nuno P. (Instituto Superior Técnico, Lisbon, Portugal)
Total IBA: Synergistic treatment of data from multiple IBA techniques (I)
Total IBA: Synergistic treatment of data from multiple IBA techniques (II)
Pitfalls in IBA data analysis (I)
Pitfalls in IBA data analysis (II) - Calculation of uncertainty budget
Depth profiling and 3D tomography for 3D RBS such as Corteo, Maria, and for calculation of depth resolution
Case study (I) - Materials science
CALLIGARO, Thomas (C2RMF - AGLAE Laboratory, Paris, France)
External nuclear microprobe specificities and challenges
Implementation of External Ion Beam Imaging
State of the art codes to affect the IBA analysis
Comparison of External Ion Imaging Techniques with Alternative Techniques
Case study (III) - Cultural Heritage materials and objects
Hands-on processing of data recorded on real samples using PYMCA
GIANONCELLI, Alessandra (Elettra Sincrotrone Trieste)
Presentation of the TwinMic beamline
GRANDE, Pedro L. (Federal University of Rio Grande do Sul, Porto Alegre, Brazil)
Fundamentals of Energy Loss
3D Characterization with MEIS
Principles and application of MEIS
PowerMeis software
Case study (II) - Nanomaterials
GREGORATTI, Luca (Elettra Sincrotrone Trieste)
Welcome and overview of Synchrotron-based analytical techniques and Elettra
Laboratory visit
SCANDOLO, Sandro (ICTP)
Overview of the ICTP and IAEA relevant activities
Evaluation of the Workshop: Best poster award, and Closing of the Workshop
SIMON, Aliz (IAEA)
Overview of the ICTP and IAEA relevant activities
Evaluation of the Workshop: Best poster award, and Closing of the Workshop
TROMBA, Giuliana (Elettra Sincrotrone Trieste)
The SYRMEP X-ray imaging beamline at Elettra: recent achievements and future perspectives
WEBB, Roger (University of Surrey, Guildford, UK)
Beyong Elemental Analysis: Elemental, Chemical and Molecular Imaging
Secondary Ion Mass Spectroscopy - SIMS, Cluster-SIMS and MeV-SIMS
Radiation damage during analysis
IBA-clinic

Organizers

Aliz Simon (IAEA), Sandro Scandolo (ICTP), Roger Webb (University of Surrey)

Co-sponsors